CVE-2019-20610
https://notcve.org/view.php?id=CVE-2019-20610
An issue was discovered on Samsung mobile devices with N(7.X) and O(8.X) (Exynos 7570, 7870, 7880, 7885, 8890, 8895, and 9810 chipsets) software. A double-fetch vulnerability in Trustlet allows arbitrary TEE code execution. The Samsung ID is SVE-2019-13910 (April 2019). Se detectó un problema en dispositivos móviles Samsung con versiones de software N(7.X) y O(8.X) (Exynos 7570, 7870, 7880, 7885, 8890, 8895 y 9810). Una vulnerabilidad de doble extracción en Trustlet permite una ejecución arbitraria de código TEE. • https://security.samsungmobile.com/securityUpdate.smsb • CWE-367: Time-of-check Time-of-use (TOCTOU) Race Condition •
CVE-2019-20601
https://notcve.org/view.php?id=CVE-2019-20601
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (Exynos7570, 7580, 7870, 7880, and 8890 chipsets) software. RKP memory corruption causes an arbitrary write to protected memory. The Samsung ID is SVE-2019-13921-2 (May 2019). Se detectó un problema en dispositivos móviles Samsung con versiones de software N(7.x), O(8.x) y P(9.0) (Exynos7570, 7580, 7870, 7880 y 8890). La corrupción de la memoria RKP provoca una escritura arbitraria en la memoria protegida. • https://security.samsungmobile.com/securityUpdate.smsb • CWE-787: Out-of-bounds Write •