CVE-2008-5383
Electronics Workbench - '.ewb' Local Stack Overflow (PoC)
Severity Score
9.3
*CVSS v2
Exploit Likelihood
*EPSS
Affected Versions
*CPE
Public Exploits
1
*Multiple Sources
Exploited in Wild
-
*KEV
Decision
-
*SSVC
Descriptions
Stack-based buffer overflow in National Instruments Electronics Workbench allows user-assisted attackers to cause a denial of service (application crash) and possibly execute arbitrary code via a crafted .ewb file.
Desbordamiento de búfer basado en pila en National Instruments Electronics Workbench permite a atacantes asistidos por el usuario provocar una denegación de servicio (caída de aplicación) y posiblemente la ejecución de código de su elección a través de un fichero .ewb manipulado.
*Credits:
N/A
CVSS Scores
Attack Vector
Attack Complexity
Authentication
Confidentiality
Integrity
Availability
* Common Vulnerability Scoring System
SSVC
- Decision:-
Exploitation
Automatable
Tech. Impact
* Organization's Worst-case Scenario
Timeline
- 2008-12-08 CVE Reserved
- 2008-12-09 CVE Published
- 2024-07-25 EPSS Updated
- 2024-08-07 CVE Updated
- 2024-08-07 First Exploit
- ---------- Exploited in Wild
- ---------- KEV Due Date
CWE
- CWE-119: Improper Restriction of Operations within the Bounds of a Memory Buffer
CAPEC
References (4)
URL | Tag | Source |
---|---|---|
http://securityreason.com/securityalert/4698 | Third Party Advisory | |
http://www.securityfocus.com/bid/32542 | Vdb Entry | |
https://exchange.xforce.ibmcloud.com/vulnerabilities/46996 | Vdb Entry |
URL | Date | SRC |
---|---|---|
https://www.exploit-db.com/exploits/7307 | 2024-08-07 |
URL | Date | SRC |
---|
URL | Date | SRC |
---|
Affected Vendors, Products, and Versions
Vendor | Product | Version | Other | Status | ||||||
---|---|---|---|---|---|---|---|---|---|---|
Vendor | Product | Version | Other | Status | <-- --> | Vendor | Product | Version | Other | Status |
National Instruments Search vendor "National Instruments" | Electronics Workbench Search vendor "National Instruments" for product "Electronics Workbench" | * | - |
Affected
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