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CVSS: 7.1EPSS: 0%CPEs: -EXPL: 0

An authenticated attacker could upload a crafted certificates leading to a permanent denial-of-service situation. • https://cert-portal.siemens.com/productcert/html/ssa-381581.html • CWE-754: Improper Check for Unusual or Exceptional Conditions •

CVSS: 4.8EPSS: 0%CPEs: -EXPL: 0

An attacker could leverage this vulnerability to crash the application causing denial of service condition. ... An attacker could leverage this vulnerability to crash the application causing denial of service condition. • https://cert-portal.siemens.com/productcert/html/ssa-824889.html https://cert-portal.siemens.com/productcert/html/ssa-959281.html • CWE-476: NULL Pointer Dereference •

CVSS: 6.2EPSS: 0%CPEs: -EXPL: 0

A Denial of Service (DoS) vulnerability exists in the jaraco/zipp library, affecting all versions prior to 3.19.1. ... Existe una vulnerabilidad de denegación de servicio (DoS) en la librería jaraco/zipp que afecta a todas las versiones anteriores a la 3.19.1. • https://github.com/jaraco/zipp/commit/fd604bd34f0343472521a36da1fbd22e793e14fd https://huntr.com/bounties/be898306-11f9-46b4-b28c-f4c4aa4ffbae https://access.redhat.com/security/cve/CVE-2024-5569 https://bugzilla.redhat.com/show_bug.cgi?id=2296413 • CWE-400: Uncontrolled Resource Consumption •

CVSS: -EPSS: 0%CPEs: -EXPL: 0

This vulnerability allows attackers to cause a Denial of Service (DoS) via a crafted POST request. ... Esta vulnerabilidad permite a los atacantes provocar una denegación de servicio (DoS) mediante una solicitud POST manipulada. • https://github.com/SunsetR/Vulnerability-information/blob/main/LBT-T300-T400_ApCliSsid_Buffer%20overflow.md •

CVSS: 5.1EPSS: 0%CPEs: -EXPL: 0

A vulnerability was discovered in Samsung Mobile Processor Exynos 980, Exynos 990, Exynos 1080, Exynos 2100, Exynos 2200, Exynos 1280, Exynos 1380, and Exynos 2400 that involves a time-of-check to time-of-use (TOCTOU) race condition, which can lead to a Denial of Service. • https://semiconductor.samsung.com/support/quality-support/product-security-updates https://semiconductor.samsung.com/support/quality-support/product-security-updates/cve-2024-27361 • CWE-367: Time-of-check Time-of-use (TOCTOU) Race Condition •