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CVSS: 7.5EPSS: 0%CPEs: 72EXPL: 0

CVE-2018-11291

https://notcve.org/view.php?id=CVE-2018-11291

In Snapdragon (Automobile, Mobile, Wear) in version IPQ8074, MDM9206, MDM9607, MDM9640, MDM9650, MSM8996AU, QCA4531, QCA6174A, QCA6564, QCA6574, QCA6574AU, QCA6584, QCA6584AU, QCA9377, QCA9378, QCA9379, SD 425, SD 427, SD 430, SD 435, SD 450, SD 600, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDM630, SDM632, SDM636, SDM660, SDX20, Snapdragon_High_Med_2016, cryptographic issues due to the random number generator was not a strong one in NAN. En Snapdragon (Automobile, Mobile y Wear) en versiones IPQ8074, MDM9206, MDM9607, MDM9640, MDM9650, MSM8996AU, QCA4531, QCA6174A, QCA6564, QCA6574, QCA6574AU, QCA6584, QCA6584AU, QCA9377, QCA9378, QCA9379, SD 425, SD 427, SD 430, SD 435, SD 450, SD 600, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDM630, SDM632, SDM636, SDM660, SDX20 y Snapdragon_High_Med_2016, hay problemas de criptografía debido a que el generador de números aleatorios no es fuerte en NAN. • http://www.securityfocus.com/bid/107681 https://www.qualcomm.com/company/product-security/bulletins • CWE-338: Use of Cryptographically Weak Pseudo-Random Number Generator (PRNG) •

CVSS: 7.8EPSS: 0%CPEs: 70EXPL: 0

CVE-2018-11268

https://notcve.org/view.php?id=CVE-2018-11268

In Snapdragon (Automobile, Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, SDX20, Snapdragon_High_Med_2016, a potential buffer overflow exists when parsing TFTP options. En Snapdragon (Automobile, Mobile y Wear) en versiones MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, SDX20 y Snapdragon_High_Med_2016, existe un potencial desbordamiento de búfer al analizar opciones TFTP. • http://www.securityfocus.com/bid/106845 https://www.qualcomm.com/company/product-security/bulletins • CWE-129: Improper Validation of Array Index •

CVSS: 7.8EPSS: 0%CPEs: 78EXPL: 0

CVE-2018-11267

https://notcve.org/view.php?id=CVE-2018-11267

In Snapdragon (Automobile, Mobile, Wear) in version MDM9206, MDM9607, MDM9615, MDM9640, MDM9650, MDM9655, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 600, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDX20, Snapdragon_High_Med_2016, when sending an malformed XML data to deviceprogrammer/firehose it may do an out of bounds buffer write allowing a region of memory to be filled with 0x20. En Snapdragon (Automobile, Mobile, Wear) in version MDM9206, MDM9607, MDM9615, MDM9640, MDM9650, MDM9655, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 600, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDX20 y Snapdragon_High_Med_2016, al enviar datos XML mal formados a deviceprogrammer/firehose se podría provocar una escritura al búfer fuera de límites, lo que permitiría que se escriba en una región de memoria con 0x20. • http://www.securityfocus.com/bid/106128 https://www.qualcomm.com/company/product-security/bulletins • CWE-129: Improper Validation of Array Index •

CVSS: 8.8EPSS: 0%CPEs: 56EXPL: 0

CVE-2018-11982

https://notcve.org/view.php?id=CVE-2018-11982

In Snapdragon (Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 835, Snapdragon_High_Med_2016, a double free of ASN1 heap memory used for EUTRA CAP container occurs during UTRAN to LTE Capability inquiry procedure. En Snapdragon (Mobile y Wear) en versiones MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 835 y Snapdragon_High_Med_2016, ocurre una doble liberación (double free) de la memoria dinámica (heap) de ASN1 empleada para el contenedor EUTRA CAP durante el procedimiento de consulta UTRAN to LTE Capability. • https://www.qualcomm.com/company/product-security/bulletins • CWE-415: Double Free •

CVSS: 7.8EPSS: 0%CPEs: 70EXPL: 0

CVE-2018-11269

https://notcve.org/view.php?id=CVE-2018-11269

In Snapdragon (Automobile, Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, SDX20, Snapdragon_High_Med_2016, a potential buffer overflow exists when parsing TFTP options. En Snapdragon (Automobile, Mobile y Wear) en versiones MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, SDX20 y Snapdragon_High_Med_2016, existe un potencial desbordamiento de búfer al analizar opciones TFTP. • http://www.securityfocus.com/bid/105838 https://www.qualcomm.com/company/product-security/bulletins • CWE-129: Improper Validation of Array Index •