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CVSS: 10.0EPSS: 0%CPEs: 58EXPL: 0

CVE-2018-11287

https://notcve.org/view.php?id=CVE-2018-11287

In Snapdragon (Automobile, Mobile, Wear) in version MDM9206, MDM9607, MDM9650, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 650/52, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, Snapdragon_High_Med_2016, incorrect control flow implementation in Video while checking buffer sufficiency. En Snapdragon (Automobile, Mobile y Wear) en versiones MDM9206, MDM9607, MDM9650, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 650/52, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710 y Snapdragon_High_Med_2016, hay una implementación incorrecta del flujo de control en Video al comprobar la suficiencia del búfer. • https://source.android.com/security/bulletin/2018-09-01#qualcomm-closed-source-components https://www.qualcomm.com/company/product-security/bulletins • CWE-20: Improper Input Validation •

CVSS: 8.8EPSS: 0%CPEs: 56EXPL: 0

CVE-2018-11982

https://notcve.org/view.php?id=CVE-2018-11982

In Snapdragon (Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 835, Snapdragon_High_Med_2016, a double free of ASN1 heap memory used for EUTRA CAP container occurs during UTRAN to LTE Capability inquiry procedure. En Snapdragon (Mobile y Wear) en versiones MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 835 y Snapdragon_High_Med_2016, ocurre una doble liberación (double free) de la memoria dinámica (heap) de ASN1 empleada para el contenedor EUTRA CAP durante el procedimiento de consulta UTRAN to LTE Capability. • https://www.qualcomm.com/company/product-security/bulletins • CWE-415: Double Free •

CVSS: 10.0EPSS: 0%CPEs: 74EXPL: 0

CVE-2017-18314

https://notcve.org/view.php?id=CVE-2017-18314

In Snapdragon (Automobile, Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, Snapdragon_High_Med_2016, on TZ cold boot the CNOC_QDSS RG0 locked by xBL_SEC is cleared by TZ. En Snapdragon (Automobile, Mobile y Wear) en versiones MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660 y Snapdragon_High_Med_2016, en TZ se podría arrancar CNOC_QDSS RG0 bloqueado por xBL_SEC al ser limpiado por TZ. • https://source.android.com/security/bulletin/2018-09-01#qualcomm-closed-source-components https://www.qualcomm.com/company/product-security/bulletins •

CVSS: 7.5EPSS: 0%CPEs: 72EXPL: 0

CVE-2018-11291

https://notcve.org/view.php?id=CVE-2018-11291

In Snapdragon (Automobile, Mobile, Wear) in version IPQ8074, MDM9206, MDM9607, MDM9640, MDM9650, MSM8996AU, QCA4531, QCA6174A, QCA6564, QCA6574, QCA6574AU, QCA6584, QCA6584AU, QCA9377, QCA9378, QCA9379, SD 425, SD 427, SD 430, SD 435, SD 450, SD 600, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDM630, SDM632, SDM636, SDM660, SDX20, Snapdragon_High_Med_2016, cryptographic issues due to the random number generator was not a strong one in NAN. En Snapdragon (Automobile, Mobile y Wear) en versiones IPQ8074, MDM9206, MDM9607, MDM9640, MDM9650, MSM8996AU, QCA4531, QCA6174A, QCA6564, QCA6574, QCA6574AU, QCA6584, QCA6584AU, QCA9377, QCA9378, QCA9379, SD 425, SD 427, SD 430, SD 435, SD 450, SD 600, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDM630, SDM632, SDM636, SDM660, SDX20 y Snapdragon_High_Med_2016, hay problemas de criptografía debido a que el generador de números aleatorios no es fuerte en NAN. • http://www.securityfocus.com/bid/107681 https://www.qualcomm.com/company/product-security/bulletins • CWE-338: Use of Cryptographically Weak Pseudo-Random Number Generator (PRNG) •

CVSS: 7.8EPSS: 0%CPEs: 70EXPL: 0

CVE-2018-11268

https://notcve.org/view.php?id=CVE-2018-11268

In Snapdragon (Automobile, Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, SDX20, Snapdragon_High_Med_2016, a potential buffer overflow exists when parsing TFTP options. En Snapdragon (Automobile, Mobile y Wear) en versiones MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 650/52, SD 810, SD 820, SD 820A, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, SDX20 y Snapdragon_High_Med_2016, existe un potencial desbordamiento de búfer al analizar opciones TFTP. • http://www.securityfocus.com/bid/106845 https://www.qualcomm.com/company/product-security/bulletins • CWE-129: Improper Validation of Array Index •