CVE-2022-25717 – Use-After-Free Issue in Display
https://notcve.org/view.php?id=CVE-2022-25717
Memory corruption in display due to double free while allocating frame buffer memory Corrupción de la memoria en la pantalla debido a la doble liberación al asignar memoria búfer de fotogramas • https://www.qualcomm.com/company/product-security/bulletins/january-2023-bulletin • CWE-415: Double Free •
CVE-2022-25715 – Incorrect type casting in Display driver
https://notcve.org/view.php?id=CVE-2022-25715
Memory corruption in display driver due to incorrect type casting while accessing the fence structure fields Corrupción de la memoria en el controlador de pantalla debido a una conversión de tipo incorrecta al acceder a los campos de la estructura de la cerca • https://www.qualcomm.com/company/product-security/bulletins/january-2023-bulletin • CWE-704: Incorrect Type Conversion or Cast •
CVE-2022-22088 – Integer Overflow to Buffer Overflow in Bluetooth HOST
https://notcve.org/view.php?id=CVE-2022-22088
Memory corruption in Bluetooth HOST due to buffer overflow while parsing the command response received from remote • https://www.qualcomm.com/company/product-security/bulletins/january-2023-bulletin • CWE-787: Out-of-bounds Write •
CVE-2022-25712
https://notcve.org/view.php?id=CVE-2022-25712
Memory corruption in camera due to buffer copy without checking size of input in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Mobile, Snapdragon Wearables Corrupción de la memoria en la cámara debido a una copia del búfer sin verificar el tamaño de la entrada en Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Mobile, Snapdragon Wearables • https://www.qualcomm.com/company/product-security/bulletins/december-2022-bulletin • CWE-120: Buffer Copy without Checking Size of Input ('Classic Buffer Overflow') •
CVE-2022-25677
https://notcve.org/view.php?id=CVE-2022-25677
Memory corruption in diag due to use after free while processing dci packet in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking Corrupción de la memoria en diagnóstico debido al use-after-free mientras se procesa el paquete dci en Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking • https://www.qualcomm.com/company/product-security/bulletins/december-2022-bulletin • CWE-416: Use After Free •