CVSS: 7.8EPSS: 0%CPEs: 70EXPL: 0CVE-2018-11899
https://notcve.org/view.php?id=CVE-2018-11899
While processing radio connection status change events, Radio index is not properly validated in Snapdragon Auto, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile and Snapdragon Voice & Music in versions MDM9206, MDM9607, MDM9640, MDM9650, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDA660, SDM439, SDM630, SDM660, SDX20, SDX24. Al procesar eventos de cambio de estado de conexión de radio, el índice de radios no se valida correctamente en Snapdragon Auto, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile y Snapdragon Voice Music en versiones MDM9206, MDM9607, MDM9640, MDM9650, MSM8996AU, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDA660, SDM439, SDM630, SDM660, SDX20 y SDX24. • https://www.qualcomm.com/company/product-security/bulletins • CWE-129: Improper Validation of Array Index •
CVSS: 7.8EPSS: 0%CPEs: 34EXPL: 0CVE-2018-11855
https://notcve.org/view.php?id=CVE-2018-11855
If an end user makes use of SCP11 sample OCE code without modification it could lead to a buffer overflow when transmitting a CAPDU in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer Electronics Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT and Snapdragon Mobile in versions MDM9607, MDM9650, MDM9655, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 636, SD 820, SD 820A, SD 835, SD 8CX, SDA660, SDM630, SDM660. Si un usuario final emplea un código OCE de muestra de SCP11 sin modificar, podría conducir a un desbordamiento de búfer al transmitir un CAPDU en Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer Electronics Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT y Snapdragon Mobile en versiones MDM9607, MDM9650, MDM9655, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 636, SD 820, SD 820A, SD 835, SD 8CX, SDA660, SDM630 y SDM660. • https://www.qualcomm.com/company/product-security/bulletins • CWE-190: Integer Overflow or Wraparound •
CVSS: 8.8EPSS: 0%CPEs: 92EXPL: 0CVE-2018-11279
https://notcve.org/view.php?id=CVE-2018-11279
Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130 La falta de comprobación del tamaño de entrada puede corromper la memoria del dispositivo debido a un desbordamiento de búfer en snapdragon automobile, snapdragon mobile y snapdragon wear en sus versiones MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016 y SXR1130. • http://www.securityfocus.com/bid/106128 https://www.qualcomm.com/company/product-security/bulletins • CWE-119: Improper Restriction of Operations within the Bounds of a Memory Buffer •
CVSS: 8.8EPSS: 0%CPEs: 32EXPL: 0CVE-2018-5879
https://notcve.org/view.php?id=CVE-2018-5879
Improper length check while processing an MQTT message can lead to heap overflow in snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630, SDM660 Comprobación de longitud incorrecta durante el procesamiento de un mensaje MQTT podría conducir a un desbordamiento de memoria dinámica (heap) en snapdragon mobile y snapdragon wear en sus versiones MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630 y SDM660. • https://www.qualcomm.com/company/product-security/bulletins • CWE-787: Out-of-bounds Write •
CVSS: 5.5EPSS: 0%CPEs: 42EXPL: 0CVE-2018-11999
https://notcve.org/view.php?id=CVE-2018-11999
Improper input validation in trustzone can lead to denial of service in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9635M, MDM9650, MDM9655, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 636, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM630, SDM660, SDX24 Validación de entradas incorrecta en trustzone puede provocar una denegación de servicio (DoS) en snapdragon automobile, snapdragon mobile y snapdragon wear en las versiones MDM9206, MDM9607, MDM9635M, MDM9650, MDM9655, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 636, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM630, SDM660 y SDX24. • http://www.securityfocus.com/bid/106128 https://www.qualcomm.com/company/product-security/bulletins • CWE-20: Improper Input Validation •